The MIT STAMP workshop is an annual industry workshop hosted by the Massachusetts Institute of Technology (MIT) to help practitioners learn more about the latest advances in STAMP-based techniques like STPA and CAST, meet with other practitioners using these methods, and to hear about applications, evaluations, and the latest developments in these powerful new approaches to system safety and cyber security. STAMP is the Systems-Theoretic Accident Model and Processes, which has been developed into STPA (Systems-Theoretic Process Analysis), a hazard analysis technique and CAST (Causal Analysis based on STAMP), a technique for accident and incident analysis.
This year, due to the coronavirus situation, the workshop will be a virtual event. Online presentations will be scheduled for a few hours a day over three weeks to limit fatigue and maximise participation. The first week will provide short tutorials to introduce the core concepts of STAMP, STPA, CAST, and related techniques, to participants follow the main presentations. These will be held over following two weeks and involve presentations, panels, and poster sessions from organizations around the world.
- 20-24 Jul 20, 10:00-14:00 EDT - Week 1: Interactive Hands-on Tutorials
- 27-31 Jul 20, 10:00-13:00 EDT - Week 2: Main Presentations
- 3-6 Aug 20, 10:00-13:00 EDT - Week 3: Main Presentations
A detailed list of presentations is available on the MIT STAMP Workshop
website. The event is free and open to the public, but requires advance registration
due to video conferencing limitations.