Supporting Event - IoT Maturity Index Standard Discussion Forum 2019 23739
Supporting Event - IoT Maturity Index Standard Discussion Forum 2019
Approved 0 Hours 1 Attending
Event name: IoT Maturity Index Standard Discussion Forum 2019
Organized by: Chinese *Institute* of Electronics Hong Kong
 
Date: 26 August *2019* (Monday)
Time: 6:30pm Refreshment : 7pm to 8:30pm
Venue:
Rm PQ306, Polytechnic University of Hong Kong
Fees: Free of charge
No. of Participants: 60 (first come first serve)
Registration: No need

Language: English
 
Supporting Organizer
Technical:  IEEE Industrial Electronics Society, Technical Committee on Sponsor Standards
IEEE Product Safety Engineering Society, Hong Kong Chapter;
IEEE Consumer Electronics Society, Hong Kong Chapter;
CCA

 
Enquiry: Ir Dr. KF Tsang (Email: ee330015@cityu.edu.hk)

Internet of Things (IoT) has become the essential building block of smart city. The robust establishment of IoT provides the basic channel for data collection and aggregation. The supplement and manifestation of artificial intelligence, edge computing, big data, anti-cyber attack measures… etc will inevitably bombard fruitful applications and usages.

 
 
In essence, there will be tons of IoT connections in the near future and massive IoT connections will be established. As such, ways to measure IoT performance will be crucial to the development of IoT solution. Unfortunately, not much attention has been drawn to the fact that there is NO universal standard on smart sensors. This seminar will address this issue and discuss the use and adoption of IEEE P2668 and IEEE P1451 to help to evaluate and thus improve the development of IoT solutions. Use cases will be discussed.


 
Date & time
Monday 26 August 2019 7:00pm HKT
End date & time
Monday 26 August 2019 8:30pm HKT
Venue
Rm PQ306, Polytechnic University of Hong Kong
Address
Hong Kong

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Date & time: 26/08/19 19:00:00 HKT